IEEE

A column-and-row-parallel CMOS image sensor with thermal and 1/f noise suppression techniques

Abstract: A CMOS image sensor architecture is presented that uses an extra level of parallelism and thermal and 1/f noise suppression techniques to achieve both low-light detection and a high frame ...
IEEE

Suppression of crosstalk by using backside deep trench isolation for 1.12μm backside illuminated CMOS image sensor

Abstract: 1.12μm backside illuminated CMOS image sensor with backside deep trench isolation (DTI) has been demonstrated for the first time. DTI is fabricated on backside pixel surface after wafer ...